X-ray Absorption Fine Structure (XAFS) spectroscopy is a powerful materials characterization technique that has historically been underutilized in industrial applications. The reason for this stems largely from XAFS measurements only being available at synchrotron x-ray sources, a model which is ill-suited for routine applications in R&D, quality control, and process monitoring. The recent emergence of high-performing, laboratory-scale XAFS instruments, however, are set to change all of that.

Download this white paper to delve into the recent development of laboratory-based, synchrotron-quality XAFS systems that are revolutionizing the field. These reliable, in-house analytical instruments are rapidly expanding access to XAFS, opening up exciting new possibilities for catalysis, electrical energy storage, heavy element chemistry, mineral extraction, and many other industrial applications.