Precision Lab Solutions for High-End Optics and Coatings
DATE
April 16, 2026
TIME
8:00 a.m. PDT, 11:00 a.m. EDT, 16:00 BST, 17:00 CEST
- Duration: 60 Minutes
Overview
Join this presentation and open discussion with industry-leading experts Patrick Muller and Kieran Evans – leaders in UV/Vis and IR analytical methods and testing techniques. This talk is designed for scientists in optics development and the high-end research of optical properties who work in academia, solar, space, defense and other high-performance applications.
Key Learning Objectives:
- Understand key measurement requirements for optical components and thin films, using both the UV/Vis/NIR and FTIR instrumentation.
- Better understand material properties for real-life applications in industry, defense and the environment.
- Learn about the importance of sampling flexibility in UV/Vis/NIR analysis.
- See how specialist infrared equipment such as Optica can further advance your research insights including in-transmission measurements.
Who Should Attend:
Scientists investigating optical properties who work in academia, solar, space, defense and other high-performance applications:
- Laboratory manager
- Material Scientist
- Research/Researcher
- Optics Scientists
- Principal Investigators
- Lead Researcher
Brought to you by:
Speakers
Kieran EvansProduct Manager – UV,
PerkinElmer UK
Dr. Patrick MüllerProduct Specialist FT-IR/FT-NIR,
PerkinElmer
Sara KobilkaContributing Editor,
C&EN Media Group
Registration
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