Materials Characterization with Lab X-ray Emission Spectroscopy (XES)

DATE

September 4, 2024

TIME

8:00 a.m. PDT, 11:00 a.m. EDT, 16:00 BST, 17:00 CEST Duration: 60 Minutes

Overview

X-ray emission spectroscopy (XES) has wide ranging element-selective chemical sensitivity to characterize valence, spin-state, ligand bonds, and more. New developments in laboratory XES instrumentation enable routine sample testing. In conjunction with laboratory X-ray absorption spectroscopy (XAS), the laboratory XES systems are finding wide ranging applications in environmental science, energy storage, and more.

In this session, we will highlight laboratory XES capabilities in two energy regimes: hard X-ray (4.5-20 keV) and tender X-ray (2-5 keV). Across these regimes, element-selective capabilities enable analysis of 3rd row transition metals, sulfur, phosphorus, and more. Join to learn more about the wide ranging capabilities and applications of X-ray emission spectroscopy.

Key Learning Objectives:

Introduction to X-ray Emission Spectroscopy and its unique capabilities for materials characterization.
Detailed look into example applications of laboratory XES.
Overview of new lab-scale XES instrumentation.
Understanding the process of conducting a laboratory XES measurement, including a real-time measurement demonstration.

Who Should Attend:

Research Scientists from Universities or Industries that routinely perform materials characterization.
Materials Characterization Lab Managers and Users interested in understanding new techniques.
Those interested in element-specific, non-destructive material analysis.

Brought to you by:

Speakers

Dr. William Holden
CTO and Co-founder,
easyXAFS

Dr. Zachary Lebens-Higgins
Testing and R&D Manager,
easyXAFS

Dr. Paul Aronstein
Applications Scientist,
easyXAFS

Melissa O'Meara
Forensic Science Consultant,
C&EN Media Group

Registration

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